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DELattice defect characterization methods
Lattice defect characterization methods, Total:44 items.
In the international standard classification, Lattice defect characterization methods involves: Vocabularies, Wood-based panels, Software development and system documentation, Ceramics, Testing of metals, Fasteners, Semiconducting materials, Non-ferrous metals, Welding, brazing and soldering, Bearings, Iron and steel products, Graphic technology, Fibre optic communications, Integrated circuits. Microelectronics, Solar energy engineering, Particle size analysis. Sieving.
Association Francaise de Normalisation, Lattice defect characterization methods
- NF ISO 5618-1:2023 Technical ceramics - Test method for surface defects of GaN crystals - Part 1: classification of defects
- NF B51-170-5*NF EN 635-5:1999 Plywood. Classification by surface appearance. Part 5 : methods for measuring and expressing characteristics and defects.
- NF EN 635-5:1999 Plywood - Classification according to the appearance of the faces - Part 5: methods of measuring and expressing characteristics and defects
- NF EN ISO 28721-5:2016 émaux vitrifiés - Appareils émaillés pour les installations industrielles - Partie 5 : présentation et caractérisation des défauts
GSO, Lattice defect characterization methods
British Standards Institution (BSI), Lattice defect characterization methods
- BS EN 635-5:1999 Plywood - Classification by surface appearance - Methods for measuring and expressing characteristics and defects
- BS ISO 5618-1:2023 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects - Classification of defects
- 23/30438675 DC BS ISO 5618-1. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects - Part 1. Classification of defects
Group Standards of the People's Republic of China, Lattice defect characterization methods
- T/SCBDIF 002-2023 LCD panel manufacturing process defect detection method
- T/IAWBS 002-2017 Test method for surface defect of silicon carbide epitaxial wafer
- T/HBZXL 005-2022 Inspection method for surface defects of stainless steel cold-rolled strip
- T/CPIA 0009-2019 Electroluminescence Imaging Method for Defect Detection of Crystalline Silicon Photovoltaic Modules
- T/ZJSEE 0010-2023 Test and defect judgement method for crystalline silicon moudules in photovoltaic power staion by electroluminescence(EL)imaging
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Lattice defect characterization methods
- GB/T 18032-2000 The inspecting method of AB microscopic defect in gallium arsenide single crystal
- GB/T 24177-2009 Standard test methods for characterizing duplex grain sizes
VN-TCVN, Lattice defect characterization methods
International Organization for Standardization (ISO), Lattice defect characterization methods
- ISO/PRF 5618-1:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects — Part 1: Classification of defects
- ISO/DIS 5618-1:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects — Part 1: Part 1: Classification of defects
- ISO 3643:2024 Rolling bearings — Ceramic rolling elements — Terms and characteristics of surface imperfections
European Committee for Standardization (CEN), Lattice defect characterization methods
- EN 635-5:1999 Plywood - Classification by surface appearance - Part 5: Methods for measuring and expressing characteristics and defects
RU-GOST R, Lattice defect characterization methods
國家市場監(jiān)督管理總局、中國國家標(biāo)準(zhǔn)化管理委員會, Lattice defect characterization methods
- GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
Korean Agency for Technology and Standards (KATS), Lattice defect characterization methods
- KS D 0258-2012(2022) Test methods of crystalline defects in silicon by preferential etch techniques
- KS C 6985-2004 Evaluation method of surface defect onfibre optic connector interfaces
- KS B ISO 23279-2013 Non-destructive testing of welds－Ultrasonic testing－Characterization of indications in welds
- KS D 0258-2012(2017) Test methods of crystalline defects in silicon by preferential etch techniques
- KS D 0258-2022 Test methods of crystalline defects in silicon by preferential etch techniques
- KS C 6985-2014 Evaluation method of surface defect on fibre optic connector interfaces
- KS C 6985-2019 Evaluation method of surface defect on fibre optic connector interfaces
- KS C 6985-2014(2019) Evaluation method of surface defect on fibre optic connector interfaces
SCC, Lattice defect characterization methods
- NS-EN 1713:1998 Non-destructive examination of welds — Ultrasonic examination — Characterization of indications in welds
- DIN EN 1713 E:2007 Draft Document - Non-destructive testing of welds - Ultrasonic testing - Characterization of indications in welds; German version prEN 1713:2007
- ISO 23279:2007/DAmd 2 Non-destructive testing of welds — Ultrasonic testing — Characterization of indications in welds — Amendment 2
- AWWA WQTC71645 Microbial Characterization of Intrusion Pathways and Pitfalls of Modeling Negative Pressure Events
- NS-EN ISO 23279:2010 Non-destructive testing of welds — Ultrasonic testing — Characterization of indications in welds (ISO 23279:2010)
Professional Standard - Machinery, Lattice defect characterization methods
- JB/T 8268-1999 Standard test method for surface defect of photoconductor for electrostatic process
- JB/T 8268-2015 Test method of surface defect for photoconductor of electrostatic copying process
Professional Standard - Ferrous Metallurgy, Lattice defect characterization methods
- YB/T 4340-2013 Standard diagrams for macrostructure dendritic and defect in continuous casting blank
Japanese Industrial Standards Committee (JISC), Lattice defect characterization methods
- JIS H 0609:1999 Test methods of crystalline defects in silicon by preferential etch techniques
American Society for Testing and Materials (ASTM), Lattice defect characterization methods