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x-ray microscope

x-ray microscope, Total:30 items.

In the international standard classification, x-ray microscope involves: Optical equipment, Protection against crime, Analytical chemistry, Optics and optical measurements.

Professional Standard - Commodity Inspection, x-ray microscope

• SN/T 2731-2010 Identification of asbestos in nonmetal minerals.X-radial diffraction instrument-microscope observation method
• SN/T 3231-2012 Determination of asbestos in talcum.Polarized light microscope and X-ray diffraction method
• SN/T 2649.2-2010 Determination of asbestos in import and export cosmetics.Part 2:X-ray diffraction and polarized light microscopy method
• SN/T 3131-2012 Determination of asbestos in bicycle brake rubbers.Palarized light microscope and X-ray diffraction method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray microscope

• GB 7667-1996 The dose of X-rays leakage from electron microscope
• GB 7667-2003 The dose of X-rays leakage from electron microscope
• GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
• GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
• GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
• GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
• GB/T 43846.3-2024 Microscopy Nomenclature of microscope objectives Part 3: Spectral transmittance
• GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope

Professional Standard - Public Safety Standards, x-ray microscope

• GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
• GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
• GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
• GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy

Professional Standard - Judicatory, x-ray microscope

• SF/T 0139-2023 Soil inspection scanning electron microscope/X-ray energy spectrometry

VDI - Verein Deutscher Ingenieure, x-ray microscope

• VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
• VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors

British Standards Institution (BSI), x-ray microscope

• BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance

Japanese Industrial Standards Committee (JISC), x-ray microscope

• JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
• JIS B 7149:1995 Microscopes -- Eyepiece reticles

SCC, x-ray microscope

• VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors

GSO, x-ray microscope

• GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

Korean Agency for Technology and Standards (KATS), x-ray microscope

• KS B 5619-1999 Microscopes-Eyepiece reticles

International Organization for Standardization (ISO), x-ray microscope

• ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
• ISO 8036:2015 Microscopes - Immersion liquids for light microscopy

Association of German Mechanical Engineers, x-ray microscope

• VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

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